AOI+AI智能檢測設備

Tool microscope integrated with automation (EFEM) functionality, equipped with SECS/GEM, as well as automated result measurement and analysis capabilities.

In the face of the complex and diverse defect patterns and highly variable production environments of the manufacturing industry, traditional AOI often struggles with misjudgments and high adjustment costs. The AI Multi-Angle Appearance Inspection Machine, centered on multi-angle simultaneous inspection and deep learning, delivers higher fault tolerance and classification accuracy. It not only solves the challenge of difficult-to-classify defects but also enables automatic sorting and continuous model enhancement, truly advancing toward high-quality smart manufacturing.

A fully automated inspection machine designed specifically for semiconductor chip heatsinks, combining deep learning models with 15 μm high-resolution optics to achieve a 99% flaw detection rate. It accurately detects exposed copper, contamination, scratches, and more, helping you enhance both production capacity and yield.